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dc.contributor.authorTwinomugisha, Morris
dc.date.accessioned2023-01-03T16:20:51Z
dc.date.available2023-01-03T16:20:51Z
dc.date.issued2022-11
dc.identifier.citationTwinomugisha, M. (2022). Unsupervised machine learning for early faulty device detection. Unpublished undergraduate dissertation. Makerere University, Kampala, Ugandaen_US
dc.identifier.urihttp://hdl.handle.net/20.500.12281/13852
dc.descriptionA dissertation submitted to the School of Statistics and Planning in partial fulfillment of the requirements of the award of the degree Of Bachelor of Statistics of Makerere Universityen_US
dc.description.abstractEarly faulty detection in air quality sensors is of increasing importance in ensuring reliable and accurate air quality readings. These sensors play a critical role in monitoring the pollution levels in the atmosphere however, due to their exposure to harsh weather, it’s natural that they will face wear and may require periodical servicing. The devices are rarely monitored in most cases, particularly in Uganda. The objective of this research is to build a model for the early detection of faulty sensors for replacement and repair. Using the unsupervised learning approaches in particular K-means and PCA; we train a predictive model and later evaluate it for accuracy using a test dataset. From the cluster analysis, the research identified 3 clusters that are; the health state cluster, nearing fault state cluster, and the faulty state cluster. The research discovered that there is no significant difference in adopting PCA as a preprocessing step in using the K-means algorithm. The research further recommended other clustering methods to be used to compare the accuracy score. It also recommended using more attributes for PCA to be effective.en_US
dc.language.isoenen_US
dc.publisherMakerere Universityen_US
dc.subjectfault detectionen_US
dc.subjectPredictive Maintenanceen_US
dc.subjectPCAen_US
dc.subjectk-means,en_US
dc.subjectair qualityen_US
dc.subjectMachine learningen_US
dc.titleUnsupervised machine learning for early faulty device detectionen_US
dc.typeThesisen_US


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